Scanning Electron Microscopy (SEM) is a cutting-edge imaging technique that utilizes a focused beam of electrons to scan the surface of a sample, producing high-resolution images with exceptional detail. Unlike traditional optical microscopes, SEM can achieve much higher magnifications and provide in-depth information about surface structures, making it an invaluable tool across various fields such as materials science, life sciences, and geology.
With years of experience in the field of electron microscopy, our team of experts is dedicated to providing high-quality SEM services tailored to meet your specific needs. We have successfully collaborated with clients from various industries, including academia, pharmaceuticals, and manufacturing, delivering precise imaging and analysis that drive innovation and research.
SEM operates by directing a focused electron beam onto the surface of a sample, generating a variety of signals, including secondary electrons, backscattered electrons, and characteristic X-rays. These signals are captured by detectors and converted into images that reveal the surface morphology and composition of the sample.
- Sample Preparation: Samples often require conductive treatment to prevent charge accumulation during electron beam exposure.
- Electron Beam Scanning: The electron beam scans the sample surface, collecting signals point by point.
- Image Generation: Signals are processed by a computer to generate high-resolution images.
